Release of Kr , Ag , Sn , I and Xe from UC x targets
نویسندگان
چکیده
The release properties of a UCx thick target associated with a hot plasma ion source have been studied. Measurements have been performed for various elements: Kr, Ag, Sn, I and Xe. The analysis is made assuming pure diffusion or pure effusion as the release processes. The results obtained are compared to the data available in the literature. 2006 Elsevier B.V. All rights reserved. PACS: 25.85.Ec; 29.25.Rm; 29.30.Kv
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تاریخ انتشار 2005